[Fall 1998 Colloquiums]
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COLLOQUIUM

DEPARTMENT OF MATHEMATICS AND STATISTICS
OAKLAND UNIVERSITY
ROCHESTER, MICHIGAN 48309

Weifu Fang
Department of Mathematics
University of West Virginia

Identification of Semiconductor Doping Profile from
Laser-Beam-Induced Current Image

Abstract

The technique of laser-beam-induced current imaging is designed to test the electrical structure of semiconductors. In this talk we will present a quantitative study of the technique. We will discuss three aspects: the mathematical modeling of the problem as an inverse problem for a set of nonlinear PDEs, the mathematical analysis involved in investigating the model, and some numerical methods for the identification problem.

372 Science and Engineering Building
Thursday, October 1, 1998
3:00­4:00 P.M.

Refreshments at 2:30­3:00 P.M. in Room 368, Science and Engineering Building